Suzhou Saimr Electronics Technology Co., Ltd.
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| Measurement Item | Accuracy |
|---|---|
| OS Test | ±5% |
| Two-wire On-resistance Measurement | 0.1Ω - 1MΩ: ±0.5% + 0.05Ω |
| Four-wire On-resistance Measurement | 10μΩ - 1MΩ: ±0.2% + 5μΩ |
| DC Resistance Test | 0.1Ω - 1MΩ: <100k: ±1% >100k: 5% |
| LCR Test | Capacitance Measurement Range: 10pF - 100μF: ±2% Resistance Measurement Range: 100mΩ - 20MΩ: ±2% Inductance Measurement Range: 10nH - 100H: ±2% |
| Diode Test | 0 - 10V: ±2% ±0.2V |
| Insulation Test | 1MΩ - 10GΩ: 1M - 100M: ±2% 100M - 1G: ±5% 1G - 5G: ±10% |
| AC Leakage Current Test | 10μA - 10mA: ±3% |
| DC Leakage Current Test | 1μA - 5mA: ±3% |
| AC Withstand Voltage Source | 30 - 1000V AC (50/60Hz): ±3% |
| Insulation/Withstand Voltage Source | 30V - 1500V DC: ±3% |
| Low Voltage Signal Source | 5V/10mA: ±3% |
| Low Voltage Test Timing Time | 10ms - 200s: ±1% |
| Voltage/Insulation Test Timing Time | 0.1s - 500s: ±1% |